Visible-Light Acousto-Optic Frequency Shifters AOMO 3200-1214
AOMO 3200-1214 is a compact visible-light acousto-optic frequency shifter using tellurium dioxide as the acousto-optic medium. It is designed for visible laser systems requiring precise frequency shifting, stable beam separation and reliable beam control. Excellent diffraction efficiency and stable acousto-optic interaction provide precise, repeatable frequency shifting, stable laser-frequency control and beam management. The excellent acousto-optic properties of TeO₂ and a broadband antireflection-coated optical design allow AOMO 3200-1214 to maintain stable optical performance across multiple visible wavelength ranges, providing efficient beam diffraction, frequency conversion and dynamic modulation. Its compact structure, high switching contrast and good system integration meet performance and reliability requirements in space-constrained optical platforms. Applications include optical testing and measurement, laser interferometry, laser Doppler velocimetry (LDV), research experimental platforms, laboratory photonic systems and OEM optical instruments, providing precise, highly stable frequency control and beam management for visible laser systems.
Overview
Specifications
| Parameter | Value |
|---|---|
| Applicable Wavelength Band | Visible Light - Near Infrared |
| Minimum Operating Wavelength | 450 nm |
| Maximum Operating Wavelength | 850 nm |
| Center Frequency | 200 MHz |
| Clear Aperture Dimension | 1.5 mm × 2.5 mm |
| Rise/Fall Time | 159 ns |
| Acousto-optic Medium | TeO₂ |
| Acoustic Velocity | 4.2 mm/μs |
| RF Bandwidth [-10 dB Return Loss] | 50 MHz(@ -10 dB Return Loss ) |
| Input Impedance | 50 Ω |
| Standing Wave Ratio | ≤ 1.3:1 |
| Insertion Loss | ≤ 4% |
| Single-Surface Reflectance | ≤ 1% |
| Antireflection Coating | MIL-C-48497 |
| Optical Power Density | 250 W/mm² |
| Extinction Ratio | ≥1000:1 |
| Polarization | At a 90° angle to the mounting plane |
| Rated RF Power [Wavelength 470nm] | 0.4 W |
| Bragg Angle [Wavelength 470nm] | 11.2 mrad |
| Beam Separation Angle [Wavelength 470nm] | 22.4 mrad |
| Rated RF Power [Wavelength 532 nm] | 0.6 W |
| Bragg Angle [Wavelength 532 nm] | 12.7 mrad |
| Beam Separation Angle [Wavelength 532 nm] | 25.4 mrad |
| Rated RF Power [Wavelength 633 nm] | 0.9 W |
| Bragg Angle [Wavelength 633 nm] | 15.1 mrad |
| Beam Separation Angle [Wavelength 633 nm] | 30.2 mrad |
| Rated RF Power [Wavelength 690nm] | 1.1 W |
| Bragg Angle [Wavelength 690nm] | 16.4 mrad |
| Beam Separation Angle [Wavelength 690nm] | 32.8 mrad |
| Diffraction Efficiency [Beam Diameter 1000 μm; Wavelength 470nm] | 85% |
| Rise Time [Beam Diameter 1000 μm; Wavelength 470nm] | 159 ns |
| Diffraction Efficiency [Beam Diameter 1000 μm; Wavelength 532 nm] | 85% |
| Rise Time [Beam Diameter 1000 μm; Wavelength 532 nm] | 159 ns |
| Diffraction Efficiency [Beam Diameter 1000 μm; Wavelength 633 nm] | 85% |
| Rise Time [Beam Diameter 1000 μm; Wavelength 633 nm] | 159 ns |
| Diffraction Efficiency [Beam Diameter 1000 μm; Wavelength 690nm] | 85% |
| Rise Time [Beam Diameter 1000 μm; Wavelength 690nm] | 159 ns |
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