Visible Acousto-Optic Deflector AODF 4200-2
The AODF 4200-2 TeO₂ 442 nm visible-light acousto-optic deflector provides high-performance control and scanning of 442 nm laser beams. TeO₂ operates in an off-axis shear-wave acoustic mode. Input polarization is 0° (parallel to the mounting plane), and output polarization 90° (perpendicular), supporting standardized optical paths and integration. The RF center frequency is 190 MHz with 150 MHz bandwidth for wideband continuous scanning. The AODF 4200-2 has a high scan angle (63.1 mrad) for wide-range deflection and precise scanning. Antireflection coatings on both sides and optical testing over a specified RF range at 488 nm ensure consistency and repeatability. It serves visible lasers, precision scanning platforms, optical instruments, and OEM photonics requiring precise acousto-optic control. Main features (source table): Model |AODF 4200-2 (97-01610-52); Medium |TeO₂; Spectral Region |Visible; Operating Wavelength |442 nm; Clear Aperture |4.8 mm; Center Frequency |190 MHz; Acoustic Velocity |0.71 mm/μs; RF Bandwidth |150 MHz; RF Power |1 W; Scan Angle |93.4 mrad; Resolvable Spots |676; Input Polarization |Horizontal; Output Polarization |Vertical; Insertion Loss |5%; Acoustic Mode |Off-Axis Shear Wave; Minimum Diffraction Efficiency |＞70%; Standing-Wave Ratio |<2.5:1. Official document:visible-light acousto-optic deflector AODF 4200-2.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Acousto-optic Medium | TeO₂ |
| Acoustic Mode | Shear, Off Axis |
| Acoustic Velocity | 0.710 mm/μs |
| Wavelengths | 442 nm |
| Input Polarization | 0° to Mounting Plane |
| Output Polarization | 90° to Mounting Plane |
| Insertion Loss [Optical Testing130~230MHz at488nm (Notes Test Condition;Does Not Replace Operating Wavelength)] | 5 % |
| Center Frequency | 190 MHz |
| RF Bandwidth | 150 MHz |
| RF Drive Power | 1.0 Watt |
| Clear Aperture Dimension | 4.8 mm |
| Average Diffraction Efficiency [Optical Testing130~230MHz at488nm (Notes Test Condition;Does Not Replace Operating Wavelength)] | >75 % |
| Diffraction Efficiency Flatness Within Bandwidth [Optical Testing130~230MHz at488nm (Notes Test Condition;Does Not Replace Operating Wavelength)] | ±10 % |
| Minimum Diffraction Efficiency [Optical Testing130~230MHz at488nm (Notes Test Condition;Does Not Replace Operating Wavelength)] | >70 % |
| Peak-to-Valley [@633 mm;Without RF Power;Unit Not Specified] | <0.100 |
| Standing Wave Ratio | <2.5:1 |
| Scan Angle [@442nm;Optical Testing130~230MHz at488nm (Notes Test Condition;Does Not Replace Operating Wavelength)] | 63.1 mrad |
| Input impedance | 50 Ohms |
| Anti-Reflection Coating [both side] | <1.0 % |
| Time Aperture | 6.5 us |
Key Features
Datasheet
Supplier Information
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