Mid-Infrared Acousto-Optic Modulators AOMO 3080-1980
AOMO 3080-1980 is a compact mid-infrared acousto-optic modulator using tellurium dioxide as the acousto-optic medium. Designed for precise beam control in mid-infrared laser systems, it provides stable beam gating, optical switching and dynamic intensity modulation. High diffraction efficiency, low insertion loss and excellent infrared beam interaction meet requirements for modulation precision, beam quality and operational stability in space-constrained photonic systems. The excellent acousto-optic properties of TeO₂ allow AOMO 3080-1980 to provide efficient, reliable mid-infrared beam modulation and distinct diffracted-beam separation. Its compact structure, low reflectance, random-polarization compatibility and high switching contrast facilitate integration into miniaturized optical layouts, maintaining low-loss transmission and stable, reliable beam control. Applications include laboratory photonic systems, optical test platforms, infrared sensing equipment, research laser systems and dedicated mid-infrared instruments, providing high-performance, highly reliable beam modulation for compact infrared laser applications.
Overview
Specifications
| Parameter | Value |
|---|---|
| Applicable Wavelength Band | Mid-Infrared |
| Minimum Wavelength | 1650 nm |
| Maximum Wavelength | 2300 nm |
| Center Frequency | 80 MHz |
| Clear Aperture Dimension | 0.5 mm × 2.5 mm |
| Rise/Fall Time | 159 ns |
| Acousto-optic Medium | TeO₂ |
| Acoustic Velocity | 4.2 mm/μs |
| RF Bandwidth [-10 dB Return Loss] | 15 MHz(@ -10 dB Return Loss ) |
| Input Impedance | 50 Ω |
| Standing Wave Ratio | ≤ 1.3:1 |
| Insertion Loss | ≤ 2% |
| Single-Surface Reflectance | ≤ 0.5% |
| Antireflection Coating Standard | MIL-C-48497 |
| Optical Power Density | 10 MW/cm² |
| Extinction Ratio | ≥1000:1 |
| Polarization | At a 90° angle to the mounting plane |
| Saturation RF Power [Wavelength 2000 nm] | 6 W |
| Bragg Angle [Wavelength 2000 nm] | 19 mrad |
| Beam Separation Angle [Wavelength 2000 nm] | 38 mrad |
| Diffraction Efficiency [Beam Diameter 300 μm; Test Wavelength 2000 nm] | 80% |
| Rise Time [Beam Diameter 300 μm; Test Wavelength 2000 nm] | 73 ns |
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