Quasi-Fermi Level Splitting Measurement System LuminQY
Ideaoptics' LuminQY quasi-Fermi-level splitting measurement system provides precise optoelectronic characterization for photovoltaic thin films. Absolute emission spectroscopy quantifies PLQY, ELQY, QFLS, pseudo JV curves, and ideality factor. Complete cells are unnecessary:films or partial devices can predict open-circuit voltage, speeding material screening, process iteration, and stability research for perovskite and CIGS photovoltaics severalfold while reducing R&D costs.4 models cover basic PL through full PL+EL+near-IR measurements.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Implemented Functions | PL/PLQY, QFLS, Pseudo-JV - Variable Light Intensity, EL/ELQY, Pseudo-JV - Variable Bias/Current |
| Laser Wavelength | Built-In Dual Excitation Channels,520nm &785nm |
| Laser Intensity Fluctuation [@ 2hours] | <1% @ 2hours |
| Light Intensity at Sample | 0.001~2Suns |
| PLQY Measurement Range | 0.01~100% |
| PL Detection Band | 560~1600nm |
| EL Detection Band | 400~1600nm |
| Spectral Resolution [@ 325~950nm ●10nm @ 950~1600nm] | 5nm @ 325~950nm ●10nm @ 950~1600nm |
| Integration Time | 4ms (Min.) |
| Signal-to-Noise Ratio at Saturation | 1000:1 |
| Cooling Temperature | Detector Temperature 40℃ Below Ambient Temperature |
| Sample Size | 25mm ×25mm;Custom Sample Stage Dimensions and Electrical Interfaces Supported |
| Dimensions | 430 (L) ×300 (W) ×178 (H) mm³;Fits a Straight-Through Main Glovebox Transfer Chamber with Inner DiameterΦ360mm and Length 600mms(Source Unit Notation) |
| Accessories | Optional Source Meter |
| Standard Light Source | Halogen Light Source with Calibrated Spectral Irradiance Curve; Covers 400~1600nm; Includes a Standard Irradiance Curve Traceable to the National Institute of Metrology, China |
| Software | LuminQY Professional Software(Optoelectronic Performance Analysis) |
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