Wafer Grating Coupling Test Station

Applicable Products: DR4 / BR4 / DR8 / 2XFR4 Coupled Components: FA / Die / Optical Fiber Motorized Axis Positioning Repeatability: ±0.05 μm

1. Automatic loading and unloading of 6-inch blue-tape inner/outer rings for coupling tests of individual dies. 2. Machine vision positioning and automatic probing, compatible with DC/RF testing. 3. Supports optical-to-optical, optoelectronic and electrical-to-electrical tests, with various tunable lasers and polarization controllers shared by parallel test stations. 4. Fast light-finding, coupling and scanning-test algorithms. 5. Fully automatic high-precision six-axis motorized modules (XYZ, θXθYθZ); dual six-axis or larger combinations can be configured as needed, supporting parallel and vertical coupling. 6. Customized chip/FA/lens tooling and fixtures with a TEC temperature-control system.

Xinertai's X-Vision active network monitoring system measures end-to-end network and application quality by actively generating network traffic. It provides 7x24-hour real-time test data, reports key link metrics such as packet loss, latency, jitter and out-of-order packets, and supports real-time alerts by email, SMS and WeChat. Its software uses a distributed architecture with layered presentation, logical-transaction and data-processing functions. Each layer can be expanded with additional servers to support large-scale monitoring. X-Vision consists of a control side and active monitoring probes. The control side may be a management controller component or deployed in Could VPC, EXSi Linux or a physical Linux host. The control side is accessed through a browser, with Google Chrome, 360 or QQ recommended. Ethernet active probes support gigabit and ten-gigabit interfaces; WLAN active probes support WIFI4/5/6/7. Probe forms include hardware, software and cloud probes. X-Vision supports both two-arm and one-arm monitoring.

The VMP3000 is Ketai Guangxin's in-house basic manual probe-stage series, balancing stability and flexibility for chips of different sizes and types under precise-positioning, vibration-isolation, and other test requirements. It ensures accurate, reliable results. The VMP3000 supports general and specialized test integration, providing cost-effective capability for industrial research-stage parameter analysis and university teaching and research.

The VMP5000 is Ketai Guangxin's in-house manual probe-stage series, balancing stability and flexibility for chips of different sizes and types under precise-positioning, temperature-control, vibration-isolation, and other requirements. It ensures accurate, reliable results. The VMP5000 supports general and specialized applications, providing high/low-temperature testing, precision control, software integration, and other capabilities during product development.