Santec Scanning Test System
The system combines a santec tunable source, santec polarization controller and santec optical power meter.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Operating Wavelength | 1260–1640 nm |
| Test Specifications | IL / RIPPLE / PDL / ADJ / NADJ / CWL / BW / TDL / CROSSTALK |
| Insertion Loss Uncertainty IL [Connector Test] | ±0.1 dB |
| Measurement Mode | Tunable Light Source + High-Speed Power Meter |
| Sweep Time | 10 s |
| Measurable Product Types | WDM / AWG / PLC / Z-Block |
Key Features
Datasheet
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Supplier Information
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