Benchtop Polycrystalline X-Ray Diffractometer (XRD) BRAGG110/210
XRD stands for X-ray diffraction. By irradiating samples such as powders, single crystals and polycrystalline bulk materials and analyzing their diffraction patterns, it provides information on composition and the internal atomic or molecular structure and form of materials. It is a powerful method for studying material phases and crystal structures. The benchtop polycrystalline X-ray diffractometer analyzes crystalline-material structure and supports qualitative, quantitative and other material analyses. Its applications extend across natural and technical sciences, materials-based disciplines and industries. It is an important analytical instrument for science and engineering universities, materials research and production departments, and industrial laboratories. The instrument uses X-ray diffraction from crystalline matter and a quasi-focusing optical-path design to collect diffraction frames, which are converted into standard diffraction patterns for qualitative and quantitative analysis.
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Overview
Specifications
| Parameter | Value |
|---|---|
| X-Ray Tube | Metal-Ceramic Tube with Cu Target; Optional Target Materials |
| Focal Spot Dimensions [Interchangeable Point/Line Focus; Source Combinations Retained] | 0.4×10 / 1×10 |
| Maximum X-Ray Generator Output | 600 W |
| Tube Voltage | 15–40 kV |
| Tube Voltage Step | 1 kV/step |
| Tube Current | 5–15 mA |
| Tube Current Step | 1 mA/step |
| Tube Voltage and Current Stability [Supply Voltage Fluctuation of 10%] | ≤0.01 % |
| Goniometer Configuration | θ/2θ |
| Diffraction Geometry | Switchable Bragg-Brentano / Debye-Scherrer |
| Goniometer Radius | 150 mm |
| Scanning/Photographic Angle Range [θ] | 0–180 ° |
| Scanning/Photographic Angle Range [2θ] | −3–150 |
| Operating Mode | Segmented / Fixed Photographic Acquisition |
| Continuous Scanning Speed [θ Axis] | 0.125–30 °/min |
| Maximum Rotational Speed [θ Axis] | 10 °/s |
| Repeatability [2θ Angle] | ≤±0.001 |
| Measurement Accuracy | ±0.02 ° |
| Detector Type | Hybrid-Pixel Photon-Counting Semiconductor Detector |
| Pixel Size | (70×70) μm² |
| Area per Detector Panel | (20.1×20.1) mm² |
| Noise | <1 cps |
| Energy Resolution | 1000 eV |
| Number of Detectors [Series Combinations Are Not Explicitly Assigned to Individual Models] | 11 / 21 |
| Maximum Linear Count Rate | 3×10⁶ |
| Cabinet Dimensions [Length × Width × Height] | 770 mm × 520 mm × 800 mm |
| Total Instrument Weight | 120 kg |
| Radiation Dose [Natural Background Not Subtracted] | ≤0.2 μSv/h |
| Safety Measures | Door Interlock / Power Protection / Overtemperature Protection |
| Filter [For Cu Target] | Ni Filter |
| Overall Instrument Stability | ≤0.2 % |
| Detector-to-Sample Distance | 150mm |
Key Features
Datasheet
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