Specifications
| Parameter | Value |
|---|---|
| Laser | 532nm TEM00 Single-Mode Laser, 50mW |
| Laser | 638nm Single-Mode Laser, 50mW |
| Laser | 785nm Single-Mode Laser, 100mW |
| High-Sensitivity Spectrometer Focal Length | 300 mm |
| Spectrometer Spectral Range | Can Cover 200-1100nm |
| Grating | Three gratings with 600, 1200 and 1800 lines can be installed simultaneously; fully automatic software-controlled switching without manual grating replacement |
| Raman Spectral Range | Can Cover 100-5000cm-1 |
| White-Light Spectrum [Without Rotating the Grating] | Entire 530nm to 800nm spectrum acquired in one exposure without rotating the grating or stitching spectra by grating rotation |
| Spectral Resolution | Better Than 2 cm⁻¹ |
| Spectral Repeatability [Routine-lab test: single-crystal silicon; 532nm excitation; 100x objective; 100 repeats; repeatability of the 520cm⁻¹ silicon Raman-peak position] | Better Than 0.05 cm⁻¹ |
| High Sensitivity [Test: single-crystal silicon; 532nm laser, ≤10.0mW; 60s integration; 5 accumulations; 100x microscope objective] | The fourth-order silicon Raman peak is clearly observable. The third-order silicon Raman peak (about 1440cm⁻¹) has signal-to-noise ratio better than 20:1. No obvious N₂ or O₂ Raman peaks; their intensities must not exceed the fourth-order peak. |
| Spectral Detector | High-end back-illuminated CCD; peak quantum efficiency >=90%; TE cooling to -60 degrees |
| True Pinhole Confocal System | For optimum confocal performance, the system must use true pinhole confocal operation rather than slit-based pseudo-confocal operation. Pinhole diameter is automatically and continuously adjustable from 10 to 100um. |
| Lateral (XY) Optical Spatial Resolution [100× dry obj.; confocal hole≥50mm; auto stage. 1D nanomaterial Ø≤50nm (perfect graphene edge OK; no grating); Raman scan⊥material, 50nm steps; intensity-profile FWHM defines lateral Raman optical resolution.] | ≤ 500 nm @ 532 nm |
| Longitudinal (Z) Spatial Resolution [100× dry obj.; confocal aperture≥50mm. Suspended few-layer graphene; Raman Z scan in 50nm steps with 100X obj.; FWHM of G-peak intensity profile defines axial Raman-imaging optical resolution.] | ≤ 1000 nm@532 nm |
| Optical Microscope | The Optical Microscope Uses Köhler Illumination |
| Brightfield/Darkfield Objective | 10x Objective, 50x Objective (Long Working Distance), 100x Objective |
Datasheet
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