AH Series Extended-Depth-of-Field Digital Microscope

AH Series Extended-Depth-of-Field Digital Microscope

Supplier
Atometrics
Category
Microscopes
Origin
China

An exclusive combination of more than 50 lens elements, a high-resolution telecentric lens and a five-axis coordinated design enables 360-degree high-definition observation without blind spots. An innovative depth-of-field compositing algorithm faithfully reproduces microscopic images at 500X. A 1/1.7-inch, 12-megapixel CMOS image sensor provides ultrahigh-resolution observation with 100% CMOS utilization, so every pixel is effective and what is seen is what is obtained.

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Overview

An exclusive combination of more than 50 lens elements, a high-resolution telecentric lens and a five-axis coordinated design enables 360-degree high-definition observation without blind spots. An innovative depth-of-field compositing algorithm faithfully reproduces microscopic images at 500X. A 1/1.7-inch, 12-megapixel CMOS image sensor provides ultrahigh-resolution observation with 100% CMOS utilization, so every pixel is effective and what is seen is what is obtained.

Applications

Failure analysis, flaw/defect observation, material microanalysis and3D observation. Failure analysis: IGBT-chip bonding; ceramic substrates; insufficient/missing solder on PCB components; capacitors; solder joints in monochrome viewing mode; metal cross-sections. Defects: chip-package gold plating; diamond particle size; connectors and cracked connector spring contacts; lens scratches; spring surfaces; needles; hearing-aid rubber; cochlear-implant screens; probes; lithium-battery electrode burrs. Micromeasurement: PCB thickness, cutting tools, TGV-glass drilling, hair diameter, TGV inner walls/foreign matter, stator-coil winding failure/surface defects. Surface analysis: metallographic friction/wear; aluminum molds; leather; material/metal strength; cutting-tool, drill and milling-cutter edges; razor-blade gears; ink print evenness and dark spots; paper fibers; material scratches; machined-metal surfaces. Material anomalies: leather and white fused alumina; glass-cover edge chips. Foreign matter: lenses, camera modules and sealing rings. Biological observation: insect hairs.

Key Features

Intelligent imaging with an extra-large depth of field; instantaneous autofocus; one-touch measurement and analysis.

Datasheet

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Supplier Information

At
Atometrics
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Banshi Intelligent Technology (Shenzhen) Co., Ltd., a national-level specialized and sophisticated "Little Giant" and high-tech enterprise, focuses on providing precision measuring instruments and semiconductor metrology equipment to global customers. Currently, Banshi Intelligent provides stable and reliable services to many well-known enterprises such as Huawei HiSilicon, CATL, II-VI, Accelink, Bozhon, Chinese Academy of Sciences, AT&S, Shennan Circuits, Kinwong, and Huatian Technology. With the mission of "Exploring the future of humanity with precision measurement" and the vision of "Becoming a leader in precision measurement", Banshi Intelligent will continue to innovate in the fields of precision measurement and semiconductor metrology, redefining the connotation of "Intelligent Manufacturing in China" with product technology, and contributing Banshi's strength to the rise of Chinese instruments. Atometrics · Detection with Heart A brand under Banshi Intelligent "Atometrics" has launched multiple high-precision measurement products such as white light interferometers, flash testers, ultra-depth-of-field microscopes, line laser sensors, point laser sensors, spectral confocal displacement sensors, line spectral displacement sensors, wafer 3D metrology, and packaging substrate 3D automatic inspection equipment. They have been widely used in semiconductors, aerospace, 3C electronics, 5G communications, new energy, biomedical and other fields. Providing customers with high-quality products and services is our unremitting pursuit. Our team of world's top scientists and experienced engineers is a key advantage to ensure customer success.

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AH Series Extended-Depth-of-Field Digital Microscope
Atometrics · Microscopes
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