Small-Area Reflectance Measurement VIS3-200-800

Small-Area Reflectance Measurement VIS3-200-800

Supplier
Jnewtech
Part Number
VIS3-200-800
Category
Optical Inspection
Origin
China

Shanghai Jiepu Technology's microscale transmission/reflection measurement system uses a ratio method to determine spectral reflectance. Its integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, fast and highly accurate reflectance measurements. A measured spot size of 50um enables transmittance and reflectance testing of small objects. An automatic stage supports planar scanning. Reflectance measurement procedure: 1. Switch off the source and acquire the spectrometer's electronic noise. 2. Switch on the source, set exposure to 100ms, place a white reference and acquire the reference spectrum. 3. Remove the white reference, place the sample and acquire its spectrum. The X axis shows wavelength and the Y axis shows the corresponding reflectance.

Specification Snapshot
Wavelength Range
200-800nm
Wavelength Accuracy
<0.5nm
Measurement Parameters
Wavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC
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Overview

Shanghai Jiepu Technology's microscale transmission/reflection measurement system uses a ratio method to determine spectral reflectance. Its integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, fast and highly accurate reflectance measurements. A measured spot size of 50um enables transmittance and reflectance testing of small objects. An automatic stage supports planar scanning. Reflectance measurement procedure: 1. Switch off the source and acquire the spectrometer's electronic noise. 2. Switch on the source, set exposure to 100ms, place a white reference and acquire the reference spectrum. 3. Remove the white reference, place the sample and acquire its spectrum. The X axis shows wavelength and the Y axis shows the corresponding reflectance.

Specifications

ParameterValue
Wavelength Range200-800nm
Applicable ApplicationsApplications Toward the UV Region
Recommended Light SourceFlashing Xenon Lamp
Wavelength Resolution2048 channels, 0.3nm spacing (minimum)
DetectorCMOS linear array, 2048 pixels, linearity >99.8%
Operating ModeSingle acquisition/continuous acquisition/external triggering
Exposure Time0.06 ms-65m
Optical slit25um ( Default ) / 50um / 100um, 200um
Illumination ReceptionReflection 90 degrees
Spot size0.05mm(At 50× Magnification)
Measurement RangeReflectance 0-100%
Single Acquisition Time0.01 s
Wavelength Accuracy<0.5nm
Wavelength Repeatability0.1nm
Reflectance Accuracy0.5%
Instrument Repeatability>99.9%
Motion StageX 300mm,Y 300mm,Z 200mm
Motion Stage AccuracyX-Y accuracy 1um, repeat positioning accuracy 1um
Continuous Operating TimeCan operate continuously for 6 hours
Mapping ImagingSupports hyperspectral mapping imaging
Measurement ParametersWavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC
CircuitBuilt-in xenon lamp control circuit
Connectors and Data30PIN connector, including USB (480Mbps)/TTL (3.3v)/RS232/485
Integration SchemeTransmittance; absorptance; reflectance; irradiance
Self-Recovery Device7x24-hour, 365-day continuous operation; built-in watchdog
Dimensions300 mm × 185 mm × 104 mm

Applications

Textile color/transmission; polymer/nanomaterial transmission/reflectance; spectacle transmission; semiconductor thickness; LED bulbs. Automotive microarea reflectance: https://www.jnewtech.com/?list_165/1274.html ; laser-engraved workpieces: https://www.jnewtech.com/?list_165/1272.html ;0.12mm silver wire: https://www.jnewtech.com/?list_165/1270.html .

Key Features

1. Advanced spectroscopy provides fast full-spectrum reflectance measurement. 2. A high-power halogen source covers 400-2500nm; an imported Japanese Hamamatsu high-precision, low-noise detector offers 2048 channels. 3. Real-time reflectance and curves span 350-1000NM. 4. A 50um spot measures microscopic transmission/reflection. 5. CIE XY/LAB color calculations. 6. Integrated analysis/management supports custom methods. 7. Thin-film reflectance inspection. Resolution reaches 0.2nm depending on wavelength range. Included objectives: 5x, 20x, 50x, 100x. SNR 800:1, snr=(Signal-Noise)/Devication; dynamic range 2000:1, DR=(saturation/Dark). External-trigger, automatic-exposure and software-exposure modes; integration 0.06ms-65s; built-in xenon control and SDK support. SpectrumFactory professional processing software: 1. Transmission/reflection measurement of glass or transparent objects; 2. Raman spectra with a laser; 3. UV absorbance with a xenon lamp and liquid concentration from Beer-Lambert law; 4. Automatic one-, two- or three-axis stage and microscope-motor control, autofocus, cameras, stitched spectra, circular-arc acquisition and S-curve acceleration/deceleration; 5. X-axis time-series stability testing with a mercury-argon lamp; 6. Y-axis time-series testing of laser center-wavelength stability; 7. Motorized microscopy for transmission/reflection and Raman hyperspectral imaging; 8. LIBS metal-composition measurement with a 1064 Nd-YAG laser; 9. Film thickness 5um-100um; 10. Colorimetry including XYZ, Lab, Yxy, HSV, LCH and RGB; 11. Remote online spectral measurements; 12. Uniformity testing, including pharmaceutical granules and LED illumination. Exceptional stability: Industrial-system stability combines spectrometer and source stability. Spectrometer intensity stability >99.99%; wavelength accuracy +/-0.5nm; wavelength temperature stability; wavelength repeatability. Halogen-lamp stability >99.9%; after 15-minute warm-up, lamp stability >99.9% and complete-system stability >99%, measured over 8 hours. An automatic microscope stage forms a micro-transmission/reflection system with Mapping scans, 1um accuracy and 2um repeatability. The microscope spot is 50um. The vis3 microscope platform and software algorithms enable hyperspectral imaging and spectral/motor Mapping.

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Supplier Information

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Jnewtech
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Shanghai Jiepu Technology Co., Ltd. is a high-tech enterprise with over ten years of experience in spectroscopy. As a leading domestic supplier of spectroscopy R&D, production and integrated solutions, we are committed to the independent R&D and production of domestic spectrometers. Our product line includes micro fiber optic spectrometers, Raman spectrometers, various transmission/reflection optical systems, Raman optical systems, and micro-imaging optical systems. We provide one-stop optical solutions for various industries. Our applications cover environmental water quality and flue gas monitoring, drug testing, public security, jewelry identification, skin quality testing, crop testing, cancer cell testing, new materials testing, etc. With a senior engineering team and cooperation with universities like Fudan and Tongji, we deliver high-performance, cost-effective products and services.

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Small-Area Reflectance Measurement VIS3-200-800
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