Workpiece Surface Cleanliness Detector-Darkroom/Hyperspectral Imaging VIS3-350-950
Shanghai Jiepu Technology's fully automatic reflectance meter uses an X300mm, Y300mm, Z200mm three-axis stage to accommodate different hardware dimensions and suitable measurement heights. An integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, rapid, high-precision reflectance measurement without sample preparation for multiple industries.
Specification Snapshot
Wavelength Range
350-950nm
Wavelength Accuracy
<0.5nm
Measurement Parameters
Wavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC
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Overview
Shanghai Jiepu Technology's fully automatic reflectance meter uses an X300mm, Y300mm, Z200mm three-axis stage to accommodate different hardware dimensions and suitable measurement heights. An integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, rapid, high-precision reflectance measurement without sample preparation for multiple industries.
Specifications
| Parameter | Value |
|---|---|
| Wavelength Range | 350-950nm |
| Applicable Applications | Applications Toward the Visible Region |
| Recommended Light Source | Halogen lamp |
| Wavelength Resolution | 2048 channels, 0.3nm spacing (minimum) |
| Detector | CMOS linear array, 2048 pixels, linearity >99.8% |
| Motion Stage | X 300mm,Y 300mm,Z 200mm |
| Motion Stage Accuracy | All-Steel Motion Platform, X-Y Accuracy 1um, Positioning Repeatability 1um |
| Continuous Operating Time | Continuous 7*24-hour operation |
| Mapping Imaging | Supports hyperspectral mapping imaging |
| Image File | Imaging files of approximately 200M are stored on disk without occupying memory; continuous 7*24-hour operation |
| Database | Supports User-Created Databases |
| Material Composition Analysis | Sample composition can be analyzed after building a custom database |
| Illumination Reception | Reflection 90 degrees |
| Spot size | 1-3mm adjustable |
| Measurement Range | Reflectance 0-100% |
| Single Acquisition Time | 0.1 seconds per point; 6000 points over 200mm*100mm in only 6 minutes |
| Wavelength Accuracy | <0.5nm |
| Wavelength Repeatability | 0.1nm |
| Reflectance Accuracy | 0.5% |
| Instrument Repeatability | >99.9% |
| Measurement Parameters | Wavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC |
| Circuit | Built-in xenon lamp control circuit |
| Connectors and Data | 30PIN connector, including USB (480Mbps)/TTL (3.3v)/RS232/485 |
| Integration Scheme | Transmittance; absorptance; reflectance; irradiance |
| Self-Recovery Device | 7x24-hour, 365-day continuous operation; built-in watchdog |
| Dimensions | 300 mm × 185 mm × 104 mm |
Applications
Textile color inspection; textile-fabric transmission and transmittance testing; transmission, transmittance, and reflectance testing of polymer and nanomaterials; eyeglass transmission testing; semiconductor film-thickness testing; LED bulb testing.
Key Features
1. Advanced spectroscopy provides fast full-spectrum reflectance measurement. 2. Distinguishes metal contamination such as iron, copper, silver, aluminum and stainless steel; acidic, alkaline and neutral cleaners; and solids such as nylon, powder and resin. 3. Three-axis travel: X300mm, Y300mm, Z200mm. 4. A high-power halogen source, movable acquisition probe and imported Hamamatsu detector provide accurate, low-noise measurement with 2048 optical channels. 5. Mapping imaging. 6. Powerful measurement/analysis/management software supports custom plans. The 350-950nm high-resolution system has motion compensation for varied sample heights and widths, mapping, planar film-thickness, color and reflectance measurement. A 200mm*100mm scan takes 6 minutes. A built-in industrial computer requires only an external monitor. SDK support simplifies integration. Three-axis platform; real-time hyperspectral imaging; reflectance calculation.
Datasheet
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Supplier Information
Shanghai Jiepu Technology Co., Ltd. is a high-tech enterprise with over ten years of experience in spectroscopy. As a leading domestic supplier of spectroscopy R&D, production and integrated solutions, we are committed to the independent R&D and production of domestic spectrometers. Our product line includes micro fiber optic spectrometers, Raman spectrometers, various transmission/reflection optical systems, Raman optical systems, and micro-imaging optical systems. We provide one-stop optical solutions for various industries. Our applications cover environmental water quality and flue gas monitoring, drug testing, public security, jewelry identification, skin quality testing, crop testing, cancer cell testing, new materials testing, etc. With a senior engineering team and cooperation with universities like Fudan and Tongji, we deliver high-performance, cost-effective products and services.
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