Workpiece Surface Cleanliness Detector-Darkroom/Hyperspectral Imaging VIS3-350-950

Workpiece Surface Cleanliness Detector-Darkroom/Hyperspectral Imaging VIS3-350-950

Supplier
Jnewtech
Part Number
VIS3-350-950
Category
Optical Inspection
Origin
China

Shanghai Jiepu Technology's fully automatic reflectance meter uses an X300mm, Y300mm, Z200mm three-axis stage to accommodate different hardware dimensions and suitable measurement heights. An integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, rapid, high-precision reflectance measurement without sample preparation for multiple industries.

Specification Snapshot
Wavelength Range
350-950nm
Wavelength Accuracy
<0.5nm
Measurement Parameters
Wavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC
Request a Quote Download Datasheet
Save to Favorites Save to Favorites

Overview

Shanghai Jiepu Technology's fully automatic reflectance meter uses an X300mm, Y300mm, Z200mm three-axis stage to accommodate different hardware dimensions and suitable measurement heights. An integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, rapid, high-precision reflectance measurement without sample preparation for multiple industries.

Specifications

ParameterValue
Wavelength Range350-950nm
Applicable ApplicationsApplications Toward the Visible Region
Recommended Light SourceHalogen lamp
Wavelength Resolution2048 channels, 0.3nm spacing (minimum)
DetectorCMOS linear array, 2048 pixels, linearity >99.8%
Motion StageX 300mm,Y 300mm,Z 200mm
Motion Stage AccuracyAll-Steel Motion Platform, X-Y Accuracy 1um, Positioning Repeatability 1um
Continuous Operating TimeContinuous 7*24-hour operation
Mapping ImagingSupports hyperspectral mapping imaging
Image FileImaging files of approximately 200M are stored on disk without occupying memory; continuous 7*24-hour operation
DatabaseSupports User-Created Databases
Material Composition AnalysisSample composition can be analyzed after building a custom database
Illumination ReceptionReflection 90 degrees
Spot size1-3mm adjustable
Measurement RangeReflectance 0-100%
Single Acquisition Time0.1 seconds per point; 6000 points over 200mm*100mm in only 6 minutes
Wavelength Accuracy<0.5nm
Wavelength Repeatability0.1nm
Reflectance Accuracy0.5%
Instrument Repeatability>99.9%
Measurement ParametersWavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC
CircuitBuilt-in xenon lamp control circuit
Connectors and Data30PIN connector, including USB (480Mbps)/TTL (3.3v)/RS232/485
Integration SchemeTransmittance; absorptance; reflectance; irradiance
Self-Recovery Device7x24-hour, 365-day continuous operation; built-in watchdog
Dimensions300 mm × 185 mm × 104 mm

Applications

Textile color inspection; textile-fabric transmission and transmittance testing; transmission, transmittance, and reflectance testing of polymer and nanomaterials; eyeglass transmission testing; semiconductor film-thickness testing; LED bulb testing.

Key Features

1. Advanced spectroscopy provides fast full-spectrum reflectance measurement. 2. Distinguishes metal contamination such as iron, copper, silver, aluminum and stainless steel; acidic, alkaline and neutral cleaners; and solids such as nylon, powder and resin. 3. Three-axis travel: X300mm, Y300mm, Z200mm. 4. A high-power halogen source, movable acquisition probe and imported Hamamatsu detector provide accurate, low-noise measurement with 2048 optical channels. 5. Mapping imaging. 6. Powerful measurement/analysis/management software supports custom plans. The 350-950nm high-resolution system has motion compensation for varied sample heights and widths, mapping, planar film-thickness, color and reflectance measurement. A 200mm*100mm scan takes 6 minutes. A built-in industrial computer requires only an external monitor. SDK support simplifies integration. Three-axis platform; real-time hyperspectral imaging; reflectance calculation.

Datasheet

Please provide your email to download the datasheet.

Your name
Email Address

Invalid email format. Please try again.

Send Request

Supplier Information

Jn
Jnewtech
View Supplier →
Shanghai Jiepu Technology Co., Ltd. is a high-tech enterprise with over ten years of experience in spectroscopy. As a leading domestic supplier of spectroscopy R&D, production and integrated solutions, we are committed to the independent R&D and production of domestic spectrometers. Our product line includes micro fiber optic spectrometers, Raman spectrometers, various transmission/reflection optical systems, Raman optical systems, and micro-imaging optical systems. We provide one-stop optical solutions for various industries. Our applications cover environmental water quality and flue gas monitoring, drug testing, public security, jewelry identification, skin quality testing, crop testing, cancer cell testing, new materials testing, etc. With a senior engineering team and cooperation with universities like Fudan and Tongji, we deliver high-performance, cost-effective products and services.

Request a Quote

Our team responds within 24–48 hours
Workpiece Surface Cleanliness Detector-Darkroom/Hyperspectral Imaging VIS3-350-950
Jnewtech · Optical Inspection
Direct from Manufacturer
Your inquiry will be sent directly to the manufacturer
Photonics Source Platform
We handles the inquiry on your behalf
Your information is protected and will never be shared without consent.
Contact Us

Loading...

GetExperimental Plan

Name

Phone

+86

Organization

Use Case

AI Parametric Selection
Smart Match · Precise Recs
Enter Specifications
AI Smart Matching
Get Best Matches
Skip Manual Comparison
Find Best Solutions Fast
Select Now →