Integrated Reflectance Measurement Instrument VIS3-350-950

Integrated Reflectance Measurement Instrument VIS3-350-950

Supplier
Jnewtech
Part Number
VIS3-350-950
Category
Optical Inspection
Origin
China

Shanghai Jiepu Technology's reflectance meter uses a ratio method to measure spectral reflectance. Its integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, fast, high-precision measurements for multiple industries, including polymers, optical lenses, various crystals, plastic boxes and textiles, and LED backlight panels.

Specification Snapshot
Wavelength Range
350-950nm
Wavelength Accuracy
<0.5nm
Measurement Parameters
Wavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC
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Overview

Shanghai Jiepu Technology's reflectance meter uses a ratio method to measure spectral reflectance. Its integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, fast, high-precision measurements for multiple industries, including polymers, optical lenses, various crystals, plastic boxes and textiles, and LED backlight panels.

Specifications

ParameterValue
Wavelength Range350-950nm
Applicable ApplicationsApplications Toward the Visible Region
Recommended Light SourceHalogen lamp
Wavelength Resolution [Min]2048 channels, 0.3nm spacing (minimum)
DetectorCMOS linear array, 2048 pixels, linearity >99.8%
Operating ModeSingle acquisition/continuous acquisition/external triggering
Exposure Time0.06 ms-65m
Optical slit25um ( Default ) / 50um / 100um, 200um
Illumination Reception [Reflection]Reflection 90 degrees /45 degrees
Spot size1-3mm adjustable
Measurement RangeReflectance 0-100%
Single Acquisition Time0.1 s
Wavelength Accuracy<0.5nm
Wavelength Repeatability0.1nm
Reflectance Accuracy0.5%
Instrument Repeatability>99.9%
Measurement ParametersWavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC
CircuitBuilt-in xenon lamp control circuit
Connectors and Data30PIN connector, including USB (480Mbps)/TTL (3.3v)/RS232/485
Integration SchemeTransmittance; absorptance; reflectance; irradiance
Self-Recovery Device7x24-hour, 365-day continuous operation; built-in watchdog
Dimensions300 mm × 185 mm × 104 mm

Applications

Textile color/transmission testing; polymer/nanomaterial transmission/reflectance; spectacle transmission; semiconductor film thickness; LED bulbs. Reflectance system on thin-film coatings: https://www.jnewtech.com/?list_165/1198.html ; on 6061 aluminum production: https://www.jnewtech.com/?list_77/1195.html .

Key Features

1. Advanced spectroscopy provides fast full-spectrum reflectance measurement. 2. A high-power halogen source covers 400-2500nm; an imported Japanese Hamamatsu high-precision, low-noise detector has 2048 channels. 3. Real-time reflectance and curves span 400-1000NM. 4. CIE XY/LAB color calculations. 5. Professional software sets, stores and prints data lists. 6. Integrated analysis/management supports custom methods. 7. Thin-film reflectance inspection meets domestic/international standards. Resolution reaches 0.2nm depending on wavelength range; high UV/VIS sensitivity; USB, RS232, TTL, 485 and modbus; SNR 800:1, snr=(Signal-Noise)/Devication; dynamic range 2000:1, DR=(saturation/Dark); ultralow stray light; external-trigger, auto-exposure and software-exposure modes; integration 8ms-65s; built-in xenon control and SDK. SpectrumFactory professional processing software: 1. Transmission/reflection measurement of glass or transparent objects; 2. Raman spectra with a laser; 3. UV absorbance with a xenon lamp and liquid concentration from Beer-Lambert law; 4. Automatic one-, two- or three-axis stage and microscope-motor control, autofocus, cameras, stitched spectra, circular-arc acquisition and S-curve acceleration/deceleration; 5. X-axis time-series stability testing with a mercury-argon lamp; 6. Y-axis time-series testing of laser center-wavelength stability; 7. Motorized microscopy for transmission/reflection and Raman hyperspectral imaging; 8. LIBS metal-composition measurement with a 1064 Nd-YAG laser; 9. Film thickness 5um-100um; 10. Colorimetry including XYZ, Lab, Yxy, HSV, LCH and RGB; 11. Remote online spectral measurements; 12. Uniformity testing, including pharmaceutical granules and LED illumination. Exceptional stability: Industrial-system stability combines spectrometer and source stability. Spectrometer intensity stability >99.99%; wavelength accuracy +/-0.5nm; wavelength temperature stability; wavelength repeatability. Halogen-lamp stability >99.9%; after 15-minute warm-up, lamp stability >99.9% and complete-system stability >99%, measured over 8 hours. VIS3 with an automatic microscope stage forms a transmission/reflection microscopy system with Mapping scans, 1um accuracy and 2um repeatability. The vis3 platform and software algorithms provide hyperspectral imaging and spectral/motor Mapping.

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Supplier Information

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Jnewtech
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Shanghai Jiepu Technology Co., Ltd. is a high-tech enterprise with over ten years of experience in spectroscopy. As a leading domestic supplier of spectroscopy R&D, production and integrated solutions, we are committed to the independent R&D and production of domestic spectrometers. Our product line includes micro fiber optic spectrometers, Raman spectrometers, various transmission/reflection optical systems, Raman optical systems, and micro-imaging optical systems. We provide one-stop optical solutions for various industries. Our applications cover environmental water quality and flue gas monitoring, drug testing, public security, jewelry identification, skin quality testing, crop testing, cancer cell testing, new materials testing, etc. With a senior engineering team and cooperation with universities like Fudan and Tongji, we deliver high-performance, cost-effective products and services.

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Integrated Reflectance Measurement Instrument VIS3-350-950
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