Integrated Reflectance Measurement Instrument VIS3-200-800
Shanghai Jiepu Technology's reflectance meter uses a ratio method to measure spectral reflectance. Its integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, fast, high-precision measurements for multiple industries, including polymers, optical lenses, various crystals, plastic boxes and textiles, and LED backlight panels.
Specification Snapshot
Wavelength Range
200-800nm
Wavelength Accuracy
<0.5nm
Measurement Parameters
Wavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC
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Overview
Shanghai Jiepu Technology's reflectance meter uses a ratio method to measure spectral reflectance. Its integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, fast, high-precision measurements for multiple industries, including polymers, optical lenses, various crystals, plastic boxes and textiles, and LED backlight panels.
Specifications
| Parameter | Value |
|---|---|
| Wavelength Range | 200-800nm |
| Applicable Applications | Applications Toward the UV Region |
| Recommended Light Source | Flashing Xenon Lamp |
| Wavelength Resolution [Min] | 2048 channels, 0.3nm spacing (minimum) |
| Detector | CMOS linear array, 2048 pixels, linearity >99.8% |
| Operating Mode | Single acquisition/continuous acquisition/external triggering |
| Exposure Time | 0.06 ms-65m |
| Optical slit | 25um ( Default ) / 50um / 100um, 200um |
| Illumination Reception [Reflection] | Reflection 90 degrees /45 degrees |
| Spot size | 1-3mm adjustable |
| Measurement Range | Reflectance 0-100% |
| Single Acquisition Time | 0.1 s |
| Wavelength Accuracy | <0.5nm |
| Wavelength Repeatability | 0.1nm |
| Reflectance Accuracy | 0.5% |
| Instrument Repeatability | >99.9% |
| Measurement Parameters | Wavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC |
| Circuit | Built-in xenon lamp control circuit |
| Connectors and Data | 30PIN connector, including USB (480Mbps)/TTL (3.3v)/RS232/485 |
| Integration Scheme | Transmittance; absorptance; reflectance; irradiance |
| Self-Recovery Device | 7x24-hour, 365-day continuous operation; built-in watchdog |
| Dimensions | 300 mm × 185 mm × 104 mm |
Applications
Textile color/transmission testing; polymer/nanomaterial transmission/reflectance; spectacle transmission; semiconductor film thickness; LED bulbs. Reflectance system on thin-film coatings: https://www.jnewtech.com/?list_165/1198.html ; on 6061 aluminum production: https://www.jnewtech.com/?list_77/1195.html .
Key Features
1. Advanced spectroscopy provides fast full-spectrum reflectance measurement. 2. A high-power halogen source covers 400-2500nm; an imported Japanese Hamamatsu high-precision, low-noise detector has 2048 channels. 3. Real-time reflectance and curves span 400-1000NM. 4. CIE XY/LAB color calculations. 5. Professional software sets, stores and prints data lists. 6. Integrated analysis/management supports custom methods. 7. Thin-film reflectance inspection meets domestic/international standards. Resolution reaches 0.2nm depending on wavelength range; high UV/VIS sensitivity; USB, RS232, TTL, 485 and modbus; SNR 800:1, snr=(Signal-Noise)/Devication; dynamic range 2000:1, DR=(saturation/Dark); ultralow stray light; external-trigger, auto-exposure and software-exposure modes; integration 8ms-65s; built-in xenon control and SDK. SpectrumFactory professional processing software: 1. Transmission/reflection measurement of glass or transparent objects; 2. Raman spectra with a laser; 3. UV absorbance with a xenon lamp and liquid concentration from Beer-Lambert law; 4. Automatic one-, two- or three-axis stage and microscope-motor control, autofocus, cameras, stitched spectra, circular-arc acquisition and S-curve acceleration/deceleration; 5. X-axis time-series stability testing with a mercury-argon lamp; 6. Y-axis time-series testing of laser center-wavelength stability; 7. Motorized microscopy for transmission/reflection and Raman hyperspectral imaging; 8. LIBS metal-composition measurement with a 1064 Nd-YAG laser; 9. Film thickness 5um-100um; 10. Colorimetry including XYZ, Lab, Yxy, HSV, LCH and RGB; 11. Remote online spectral measurements; 12. Uniformity testing, including pharmaceutical granules and LED illumination. Exceptional stability: Industrial-system stability combines spectrometer and source stability. Spectrometer intensity stability >99.99%; wavelength accuracy +/-0.5nm; wavelength temperature stability; wavelength repeatability. Halogen-lamp stability >99.9%; after 15-minute warm-up, lamp stability >99.9% and complete-system stability >99%, measured over 8 hours. VIS3 with an automatic microscope stage forms a transmission/reflection microscopy system with Mapping scans, 1um accuracy and 2um repeatability. The vis3 platform and software algorithms provide hyperspectral imaging and spectral/motor Mapping.
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Supplier Information
Shanghai Jiepu Technology Co., Ltd. is a high-tech enterprise with over ten years of experience in spectroscopy. As a leading domestic supplier of spectroscopy R&D, production and integrated solutions, we are committed to the independent R&D and production of domestic spectrometers. Our product line includes micro fiber optic spectrometers, Raman spectrometers, various transmission/reflection optical systems, Raman optical systems, and micro-imaging optical systems. We provide one-stop optical solutions for various industries. Our applications cover environmental water quality and flue gas monitoring, drug testing, public security, jewelry identification, skin quality testing, crop testing, cancer cell testing, new materials testing, etc. With a senior engineering team and cooperation with universities like Fudan and Tongji, we deliver high-performance, cost-effective products and services.
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