Full Automatic Microcode Reader

Laser systems: max: ≤120mm/s; Static repetition; ≤±0.02 mm Platform repeat location precision: Max:360mm300mm100mm Min:140mm50mm10mm Power stability: ≤3%

The equipment is used for PIN needle testing for finished/semi-finished plugins; slant/squadness, break, drawback, needle reduction for detectable PIN needles; availability, location, disability of logo labels; high appearance screws. Equipment integrated into mechanics; 2D camera/3D camera; 6-side detection of product and automatic handling

Up and down: It's a semiconductor crystal Test material: Silicon carbide bottom Test Size: 8/12inch

Overall introduction; compact design structures for human engineering to facilitate the layout of the line; automatic handling; Bernuli non-contact vacuum sorption; positive detection at < 0.01 per cent; positive automatic locator reading; utilization of algorithms; dilution of markings in lined image of metallurgical support parts; focus system; real-time focus system; ensuring that no more than 1 micrometre of the lens ' s focal range is moved; shared automated focus data detection of defects; 25 per cent improvement in more traditional ways of image resolution of defects; easier identification of defects; high-precision classification of defects; correct capability for classification of defects; high-speed imaging technology; 100 per cent resolution, 400 per cent increase in data volume and 5 per cent reduction in processing time; automatic back-turning; automatic locatoring digital; HG self-study of Abrain algorithms for high-level learning understanding of defects

Static Repeatability: ±2μm Three dollar correlations: ≤0.01mm Type of measurement: Match

Applies to the automobile industry; measures that can be used for products such as electropulsive shell/engine rotor/ fixed/parts; exposure approach; take point measurements of the plane or coaxial extent of the product ' s appearance; achieve high accuracy and performance control of the product ' s appearance; and strictly control the outflow of undesirable products

Aeye0813 equipment in the Spectrum Series; upstream basic materials in the light chip industrial chain; introduction of an independently developed multi-channel optical detection system; detection of visual defects in lithium acetate liner (LINbO3), phosphoride liner (InP), arsenic liner (GaAs) and sapphire liner