XC-ST30/XC-ST30CE

Spectral range: 400~1000um Number of wavelength bands: >100 Pattern Resolution: 1024 mm × 1024 mm

Spectral range: 400~1000um Number of wavelength bands: >100 Pattern Resolution: 1024 mm × 1024 mm

Spectral range: 900~1700nm Number of wavelength bands: ≥100 Pattern Resolution: 1024 mm × 1024 mm

This highly integrated microscopic imaging system accepts different configuration modules to meet varied application needs. Supported basic configurations include upright reflected light, upright transmitted light, inverted reflected light and inverted transmitted light. Applications include wide-field illumination, fluorescence imaging, cell imaging, particle imaging, semiconductor surface inspection, internal defect detection and failure analysis.

The fully automatic multicolor fluorescence microscopy system supports brightfield, darkfield and multicolor fluorescence imaging. Laser autofocus or image-processing focus can be selected for wide-field scanning. Optional multiwavelength LED or laser excitation sources extend imaging coverage to near-infrared wavelengths.