Portable Measuring Microscope
Portable Measuring Microscope_Shanghai Xingqing Optical Instrument Co., Ltd. Portable Measuring Microscope Portable Measuring Microscope_Shanghai Xingqing Optical Instrument Co., Ltd. Home About Us Company Profile Honors Product Introduction Spherical Interferometer Plane Interferometer Dynamic Interferometer ZPS Interference Analysis System Robotic Arm Polishing System Other Optical Instruments Precision Optical Cold Processing Optical Calculation Tools Data Download Company News Contact Us EN EN Home About Us Product Introduction Spherical Interferometer Plane Interferometer Dynamic Interferometer ZPS Interference Analysis System Robotic Arm Polishing System Other Optical Instruments Precision Optical Cold Processing Data Download Company News Contact Us Products Spherical Interferometer Plane Interferometer Dynamic Interferometer ZPS Interference Analysis System Robotic Arm Polishing System Other Optical Instruments Precision Optical Cold Processing Home > Product Introduction > Other Optical Instruments Portable Measuring Microscope Product Model: Application Technical Parameters This device is suitable for online inspection of powder particles, surface dents, scratches, and surface coating thickness, and is an important online tool for surface defect quality inspection and material hardness testing. It is widely used in light industry, machinery, electronics, printing, and other industries. Eyepiece magnification 15×, 10× Eyepiece micrometer 0~8mm Minimum division value of eyepiece micrometer drum 0.01mm Eyepiece linear field of view 8.5mm Objective magnification 4×, 2× Measurement accuracy ±0.005mm, ±0.01mm System magnification 60×, 30×/40×, 20× Contact address: No. 68, LianDong U Valley North Zone, No. 818 Xianing Road, Jinshan District, Shanghai Sales hotline: 021-54352518 Recipient name: Hu Yuzhe Contact email: huyuzhe@vip.sina.com Product List Data Download Optical Calculation Tools Contact Us Back to Top Copyright © 2025. Shanghai Xingqing Optical Instrument Co., Ltd. All Rights Reserved ICP No. 11049564-2 Shanghai
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Overview
Specifications
| Parameter | Value |
|---|---|
| Eyepiece Magnification | 15×、10× |
| Eyepiece Micrometer Scale | 0～8mm |
| Eyepiece Micrometer Drum Minimum Division | 0.01mm |
| Eyepiece Linear Field of View | 8.5mm |
| Measurement Precision | ±0.005mm、 ±0.01mm |
| System Magnification | 60×、30×/40×、20× |
Applications
Datasheet
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