Electroluminescence Quantum Efficiency Measurement Instrument HiYield-EL

Phase Noise Measurement Level: 10Hz; 100Hz; 1kHz; 1MHz Scale width precision: <3Hz System White Noise Floor: -160dBc/Hz@1MHz

The LD series laser-line width/noise gauge uses an innovative, interconnective detection and high-speed interconnectivity algorithm; can significantly reduce the introduction of additional noise into the test system; without the need for additional low-noise reference light sources and assistive devices; can achieve real-time high accuracy measurements of laser phase noise and linear width and are not limited by light source wavelengths; and measure accuracy of the fraction width can reach the Hz level. Super-low-level phase noise/frequency noise measurement Accurate definition of the width of the fraction/FHWM line A real-time rapid measurement Without the need for stable reference light source full-band measurements A simple operational interface (keyrat/touch screen control) Support customisation, performance and extension beyond basic laser phase noise and width (cumulation & background) measurement functions; this product also provides a dedicated module upgrade/sorting program; it expands the following functions; laser relative strength noise (RIN) measurements Microwave signal phase noise/frequency noise measurements

The laser tube LIV test system is a test system consisting of laser drivers, laser traps, photopower test modules and upper machine software. The main functions performed by the test system are to test the laser's LIV curve properties, the Kink point and the threshold current. Drivers are self-developed by the company; they are accompanied by custom-made laser traps; and a variety of sealed lasers, such as butterflies, DIL, TO, FP, etc. The drive has high accuracy current and temperature control. The test system is characterized by a high rate of test response; it takes less than 60 seconds for 100 test points at 0.01°C. Test ranges can be customised; users can set different current steps in different test ranges to improve test efficiency and accuracy. High-precision, high-stable temperature, high-precision current control

The wiring test system designed by the company is a fully autonomous set of systems that have the advantage of being capable of testing the wiring, data accuracy, operational simplicity and suitability. The ultra-low noise drive of OUD-600B, which was developed by my company; the test results were more accurate. Performance characteristics: Minimum test line width 0.9 kHz to test wavelength wide detector sensitivity high embedded light decay; fit for different power lasers equipped with 4.3 inches of high-resolution touch screen; interface simple beauty

Current Settings Range: 0.1A-80A Minimal pulse current step: 100mA Pulse Current Output Accuracy: 100mA 3%of setpoint

SMP2008 is a high-precision pulse source table of large currents, narrow veins, high voltage; supports ns-level narrow pulse output, PIV curve scans and characterization parameter analysis; supports touchscreen and key-based operations; supports multiple communication interfaces and UCD data preservation; integrates pulsive voltage sources, current meters, voltage meters and photopower meters; and is user-friendly. Supports the minimum narrow pulse width 10ns pulse output test. Maximum outputable pulse current 80A; support pulse current waveform monitoring. Support for PI, VI measurements and their curves. Supports the real-time preservation of test data and curves on disks. Support for voltage, current and power calibration. Multiple interfaces such as Internet, serial and USB are supported. Support for uplifting operations. Provide external pointsball test power (selection)

• Multi-product free switching; one-key switching. • Supporting microcodes of various specifications; e.g., DM; QR; etc. • High-resolution imaging systems; 600W resolution industrial array cameras; support for coaxies; external lighting systems. • High resolution; high precision; and 10x high-resolution mirrors to achieve micro-level recognition. • Microcode Depth Automatic Measurement; Content Reading; Quality Level Output; Microcode Size; Code Point Size Measurement. • High-precision three-axis motion control platform adapted to different sizes; microcode measurements of product at different locations. • Auto-correction function for 2D level target; measurement errors that reduce anthropogenic factors; vacuum negative pressure adsorption systems; ensuring measurement stability