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High Speed Swept Test System
The High Speed Swept Test System is designed to streamline photonic testing, providing a complete solution for high-speed analysis, high resolution, and accuracy. It combines Santec's tunable lasers (TSL-770 or TSL-570), optical power meter (MPM-210H), polarization control units (PCU-110), and custom software to optimize WDL and PDL measurement for R&D and production environments.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Wavelength Accuracy (typ.) (Absolute) Type A | ±12pm at 50nm/s, ±15pm at 100nm/s, ±17pm at 200nm/s |
| Wavelength Accuracy (typ.) (Absolute) Type C | ±2.5pm at 50nm/s, ±3.5pm at 100nm/s, ±4.0pm at 200nm/s |
| Wavelength Accuracy (typ.) (Absolute) Type P | ±1.0pm at 50nm/s, ±1.5pm at 100nm/s, ±2.0pm at 200nm/s |
| Wavelength Accuracy (typ.) (Relative) Type A | ±12pm at 50nm/s, ±17pm at 100nm/s, ±20pm at 200nm/s |
| Wavelength Accuracy (typ.) (Relative) Type C | ±3.0pm at 50nm/s, ±4.0pm at 100nm/s, ±4.3pm at 200nm/s |
| Wavelength Accuracy (typ.) (Relative) Type P | ±1.3pm at 50nm/s, ±1.5pm at 100nm/s, ±2.0pm at 200nm/s |
| Wavelength Repeatability Type A | ±5pm at 50nm/s, ±6pm at 100nm/s, ±8pm at 200nm/s |
| Wavelength Repeatability Type C | ±1.2pm at 50nm/s, ±2.0pm at 100nm/s, ±2.2pm at 200nm/s |
| Wavelength Repeatability Type P | ±0.5pm at 50nm/s, ±1.0pm at 100nm/s, ±1.1pm at 200nm/s |
| Scan Speed | 1 to 200nm/s |
| Dynamic Range for Insertion Loss at one scan (typ.) MPM-211, 212 | 40dB |
| Dynamic Range for Insertion Loss at one scan (typ.) MPM-215 | 60dB |
| Dynamic Range for Insertion Loss at two scan (typ.) MPM-211, 212 | 75dB |
| Dynamic Range for PDL (typ.) | 0 to 5dB |
| Measurement Time for IL (typ.) MPM-211, 212 | 3×100nm/s, 1.5×200nm/s |
| Measurement Time for IL (typ.) MPM-215 | 12×100nm/s, 6×200nm/s |
| Wavelength Resolution | 0.1pm |
| IL Accuracy (typ.) | ±0.02dB (0 to 30dB Device IL), ±0.1dB (30 to 40dB Device IL), ±0.1dB (40 to 60dB Device IL) |
| IL Repeatability (typ.) | ±0.02dB |
| IL Resolution | 0.001dB |
| PDL Accuracy (typ.) | ±(0.02+3% of PDL) (0 to 20dB Device IL), ±(0.15+3% of PDL) (20 to 40dB Device IL) |
| PDL Repeatability (typ.) | ±0.01dB |
| PDL Resolution | 0.001dB |
| Communication | USB (USB2.0 High Speed), GP-IB (IEEE488.2), Ethernet |
| Operating Temperature | 15 to 35°C |
| Operating Humidity | <80% non-condensing |
Applications
Key Features
Datasheet
Supplier Information
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