CTP10 Component Test Platform
The CTP10 is a modular passive optical component testing platform designed for high-speed, accurate, and flexible testing of passive optical components. It offers advanced spectral characterization methods, including insertion loss (IL), return loss (RL), polarization dependent loss (PDL), and photocurrent measurements across the full telecom wavelength range.
Specification Snapshot
Return Loss (Typical)
>56dB (OPMx), >49dB (OPMLite)
Dimensions (Mainframe - H x W x D)
178mm x 482mm x 435mm (7in x 19in x 17in)
Dynamic Range (Typical at 10nm/s)
>70dB
Dynamic Range (Typical at 100nm/s)
>80dB
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Overview
The CTP10 is a modular passive optical component testing platform designed for high-speed, accurate, and flexible testing of passive optical components. It offers advanced spectral characterization methods, including insertion loss (IL), return loss (RL), polarization dependent loss (PDL), and photocurrent measurements across the full telecom wavelength range.
Specifications
| Parameter | Value |
|---|---|
| Sensor Type | Temperature-controlled InGaAs (OPMx), Uncooled InGaAs (OPMLite) |
| Compatible Fiber Type | SMF28 |
| Compatible Optical Adaptors | FC or SC connectors (OPMx), Fixed FC/APC connectors (OPMLite) |
| Maximum Safe Power | 11dBm (OPMx), 18dBm (OPMLite) |
| Display Acquisition Resolution | <0.0001dB |
| Return Loss (Typical) | >56dB (OPMx), >49dB (OPMLite) |
| Polarization Dependent Response (Typical) | 0.05dB |
| Insertion Loss Linearity (Characteristic at 10nm/s) | Over 30dB range: ±0.025dB, Over 65dB range: ±0.035dB |
| Insertion Loss Linearity (Characteristic at 100nm/s) | Over 30dB range: ±0.035dB, Over 60dB range: ±0.035dB |
| Photocurrent Range | -85dBmA to 10dBmA |
| Current Uncertainty (Characteristic) | ±1% |
| Linearity (Characteristic) | ±0.05dB ±2pA |
| Noise 2 (Typical at 10nm/s) | 8dBmA to -20dBmA: ±0.005dB, -20dBmA to -40dBmA: ±0.030dB, -40dBmA to -50dBmA: ±0.150dB, -50dBmA to -60dBmA: ±0.500dB |
| Noise 2 (Typical at 100nm/s) | -20dBmA to -40dBmA: ±0.030dB, -40dBmA to -50dBmA: ±0.150dB, -50dBmA to -60dBmA: ±0.500dB |
| Maximum Safe Current | 11dBmA |
| Connectors | Triaxial 2-lug Pomona |
| Photodiode | InGaAs, 1mm diameter photodiode compatible with FOA adaptor |
| Triaxial Cable | 3m long triaxial cable with triaxial 2-lug connectors |
| Display Ports | 2x Display port, compatible with split screen display and touchscreen with multitouch control |
| Remote Interface | Ethernet (Option: GPIB) |
| Electrical Inputs (Hardware Ready) | 10x BNC |
| Electrical Outputs (Hardware Ready) | 7x BNC including 2 analog output ports |
| Number of Module Slots | 10 |
| Other Inputs | 2x USB 3.0, 3x USB-A 2.0 |
| Hard Drive | SSD, 960GB |
| Storage Temperature | -20°C to 65°C (-4°F to 149°F) |
| Operating Temperature | 5°C to 40°C (41°F to 104°F) |
| Mainframe Weight | 9.15kg (20.2lb) |
| Module Weight | 1kg to 2.8kg (2.2lb to 6.2lb) |
| Dimensions (Mainframe - H x W x D) | 178mm x 482mm x 435mm (7in x 19in x 17in) |
| Power Supply | 100V to 240V AC (50/60Hz) |
| Specified Wavelength Range | 1260nm–1620nm (IL PDL OPM2), 1250nm–1630nm (IL RL OPM2) |
| Operating Wavelength Range | 1240nm–1680nm |
| Wavelength Uncertainty (Typical) | ±5pm |
| Wavelength Repeatability (Typical) | ±1pm |
| Wavelength Display Resolution | Standard mode: 1pm to 250pm, High-resolution mode: 0.02pm to 0.5pm |
| Measurable Response Variation (Typical) | >10000dB/nm at 100nm/s |
| PDL Measurement Method | 4-States Mueller |
| PDL Uncertainty (Typical at 100nm/s) | ±0.06dB ±1% 'PDL' |
| Dynamic Range (Typical at 10nm/s) | >70dB |
| Dynamic Range (Typical at 100nm/s) | >80dB |
| Insertion Loss | 0dB to 20dB: ±0.005dB, 20dB to 40dB: ±0.010dB, 40dB to 50dB: ±0.030dB, 50dB to 60dB: ±0.075dB |
Applications
1. Testing passive optical components in R&D and manufacturing environments 2. Characterizing wavelength selective switches and DWDM multiplexers 3. Measuring insertion loss, return loss, and polarization dependent loss 4. Spectral characterization of optical components 5. Testing photonic integrated circuits (PIC) and thin film filters
Key Features
1. Modular design for flexible configurations 2. High-speed and accurate spectral measurements 3. Supports up to 10 hot-swappable modules 4. Advanced GUI for intuitive operation and analysis 5. Full-band testing capabilities with multiple tunable lasers
Datasheet
Product Datasheet
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Supplier Information
<p>EXFO develops smarter test, monitoring and analytics solutions for the global communications industry. As a trusted advisor, we serve fixed and mobile network operators, hyperscale data centers, and leaders in production and R&D. We provide insights into superior network performance, service reliability, and user experience. Backed by 40 years of innovation, EXFO uniquely combines equipment, software and services to enable customers to upgrade 5G, cloud-native and fiber networks faster and more reliably.</p>
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