enAF Microscope 400kHz 28.1x EO-IM-MXC50-005
The enAF Microscope 400kHz 28.1x autofocus system was designed by Envision using autofocus-switch and image-contrast technology. It uses laser triangulation, supports 400kHz line-scan cameras and 28.1× microscope zoom, and precisely measures object distance from spot displacement. This is converted in real time into lens-drive commands for fast, precise focusing. The system offers non-contact operation, fast response, and strong interference resistance without dependence on image texture. It is suitable for high-speed line-scan inspection of displays, silicon wafers, PCBs, and films.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Series | enAF Microscope 400kHz |
| Scanning Speed | 70 mm/s |
| Maximum Tracking Error | 0.4 μm |
| Minimum Depth of Field (DOF) | Depends on Objective |
| Optical Magnification | 28.1x (12.5x/2.25x) |
| Focusing Range | 8 mm |
| Slope | 20µm/50mm |
| Camera Model | Linea HS 16K 400kHz |
| Lens Model | Mag.x system 125 |
| PC Interface | Ethernet |
| Motion | Single-Axis Motion |
| Camera Type | Linear Array |
Key Features
Datasheet
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Supplier Information
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