Small-Angle X-Ray Scattering (SAXS) Testing
X-ray diffraction (XRD) is a nondestructive technique for characterizing crystalline materials. Powder diffraction images reveal crystal structure, phases and preferred orientation; calculations yield component content, average grain size, crystallinity, stress/strain and crystal defects. Adjusting the optics enables XRR measurements of thin-film thickness, surface roughness and density, plus semiconductor-film rocking curves and high-resolution reciprocal-space maps (RSM) with high-resolution optics. Small-angle scattering is correlated X-ray scattering by electrons near low angles as X-rays traverse a sample. It characterizes long-period/quasiperiodic structures, nanoscale average particle-size distributions and mesopore sizes. The supplier offers SAXS testing to obtain low-angle scattering images.
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