Powder Sample Phase Analysis
X-ray diffraction (XRD) is a nondestructive technique for characterizing crystalline materials. Powder diffraction images reveal crystal structure, phases and preferred orientation; calculations yield component content, average grain size, crystallinity, stress/strain and crystal defects. Adjusting the optics enables XRR measurements of thin-film thickness, surface roughness and density, plus semiconductor-film rocking curves and high-resolution reciprocal-space maps (RSM) with high-resolution optics. A Bragg-BrentanoHD incident-beam module completely filters Kbeta and lowers white-radiation background. Combined with a PIXcel 3D Medipix 1×1 array detector, it gives high-intensity, high-quality powder diffraction. Patterns can be matched to a PDF reference-card database to identify phases, with data quality suitable for Rietveld refinement.
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Database Platform