Powder Sample Phase Analysis

Powder Sample Phase Analysis

Supplier
Hongce-opt
Category
Technical Services
Origin
China

X-ray diffraction (XRD) is a nondestructive technique for characterizing crystalline materials. Powder diffraction images reveal crystal structure, phases and preferred orientation; calculations yield component content, average grain size, crystallinity, stress/strain and crystal defects. Adjusting the optics enables XRR measurements of thin-film thickness, surface roughness and density, plus semiconductor-film rocking curves and high-resolution reciprocal-space maps (RSM) with high-resolution optics. A Bragg-BrentanoHD incident-beam module completely filters Kbeta and lowers white-radiation background. Combined with a PIXcel 3D Medipix 1×1 array detector, it gives high-intensity, high-quality powder diffraction. Patterns can be matched to a PDF reference-card database to identify phases, with data quality suitable for Rietveld refinement.

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Overview

X-ray diffraction (XRD) is a nondestructive technique for characterizing crystalline materials. Powder diffraction images reveal crystal structure, phases and preferred orientation; calculations yield component content, average grain size, crystallinity, stress/strain and crystal defects. Adjusting the optics enables XRR measurements of thin-film thickness, surface roughness and density, plus semiconductor-film rocking curves and high-resolution reciprocal-space maps (RSM) with high-resolution optics. A Bragg-BrentanoHD incident-beam module completely filters Kbeta and lowers white-radiation background. Combined with a PIXcel 3D Medipix 1×1 array detector, it gives high-intensity, high-quality powder diffraction. Patterns can be matched to a PDF reference-card database to identify phases, with data quality suitable for Rietveld refinement.

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Supplier Information

Ho
Hongce-opt
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Suzhou Hongce Optoelectronics Technology Co., Ltd., founded in August 2015, specializes in the R&D and production of precision optical nano-film devices and PVD coating equipment, covering wavelength ranges from infrared to X-ray and neutron optics, providing one-stop solutions. The company has mastered core technologies in short-wavelength optics such as EUV and X-ray, achieving domestic substitution. With multiple coating and testing equipment, it holds over 40 intellectual properties. Products include DUV/EUV lithography thin-film devices, laser films, multilayer Laue lenses (MLL), X-ray detection crystals, serving major national scientific platforms like lithography, synchrotron radiation, and elemental analysis.

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Powder Sample Phase Analysis
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