High-Resolution Optical Path Testing

High-Resolution Optical Path Testing

Supplier
Hongce-opt
Category
Technical Services
Origin
China

X-ray diffraction (XRD) is a nondestructive technique for characterizing crystalline materials. Powder diffraction images reveal crystal structure, phases and preferred orientation; calculations yield component content, average grain size, crystallinity, stress/strain and crystal defects. Adjusting the optics enables XRR measurements of thin-film thickness, roughness and density, plus semiconductor rocking curves and high-resolution reciprocal-space maps (RSM). The Hybrid high-resolution optics module supports rocking curves, Phi scans, XRR and 2D RSM. Single-crystal tests require the measured crystal-plane identity and its d-spacing or 2Theta. Phi scans require the sample-normal d-spacing/angle and angle between normal and measured plane. RSM requires normal d-spacing/2theta, measured-plane d-spacing/2theta and the angle between measured and normal planes.

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Overview

X-ray diffraction (XRD) is a nondestructive technique for characterizing crystalline materials. Powder diffraction images reveal crystal structure, phases and preferred orientation; calculations yield component content, average grain size, crystallinity, stress/strain and crystal defects. Adjusting the optics enables XRR measurements of thin-film thickness, roughness and density, plus semiconductor rocking curves and high-resolution reciprocal-space maps (RSM). The Hybrid high-resolution optics module supports rocking curves, Phi scans, XRR and 2D RSM. Single-crystal tests require the measured crystal-plane identity and its d-spacing or 2Theta. Phi scans require the sample-normal d-spacing/angle and angle between normal and measured plane. RSM requires normal d-spacing/2theta, measured-plane d-spacing/2theta and the angle between measured and normal planes.

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Ho
Hongce-opt
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Suzhou Hongce Optoelectronics Technology Co., Ltd., founded in August 2015, specializes in the R&D and production of precision optical nano-film devices and PVD coating equipment, covering wavelength ranges from infrared to X-ray and neutron optics, providing one-stop solutions. The company has mastered core technologies in short-wavelength optics such as EUV and X-ray, achieving domestic substitution. With multiple coating and testing equipment, it holds over 40 intellectual properties. Products include DUV/EUV lithography thin-film devices, laser films, multilayer Laue lenses (MLL), X-ray detection crystals, serving major national scientific platforms like lithography, synchrotron radiation, and elemental analysis.

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High-Resolution Optical Path Testing
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