Transmission Diffraction Testing
X-ray diffraction (XRD) is a nondestructive technique for characterizing crystalline materials. Powder diffraction images reveal crystal structure, phases and preferred orientation; calculations yield component content, average grain size, crystallinity, stress/strain and crystal defects. Adjusting the optics enables XRR measurements of thin-film thickness, surface roughness and density, plus semiconductor-film rocking curves and high-resolution reciprocal-space maps (RSM) with high-resolution optics. A focusing-mirror module enables transmission diffraction: X-rays pass through the sample and the detector collects diffraction on the opposite side, unlike reflection geometry with both paths on one side. Transmission reveals deeper sample information rather than the prepared surface layer measured in reflection.
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