BEX-8507 PN junction and Boltzmann constant experiment apparatus
This apparatus uses a microcurrent source to provide forward current through a PN junction. Adjusting the source determines forward voltage drop while avoiding instability in microcurrent measurements and enabling accurate voltage-drop measurements. A temperature-control unit provides current-voltage curves at different temperatures for studying the relationships among junction voltage, current, and temperature, obtaining Boltzmann's constant k, sensitivity S, and the silicon band gap. An optional PASCO interface provides efficient, accurate digital acquisition and analysis.
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Overview
Specifications
| Parameter | Value |
|---|---|
| PN-junction characteristics and Boltzmann-constant experimental apparatus - Microcurrent output in 4 ranges | 10⁻⁶~10⁻⁹A |
| PN-junction characteristics and Boltzmann-constant experimental apparatus - Microcurrent-output range | 2nA-1mA |
| Temperature-control power supply II - Temperature-control range | Room temperature to 100℃ |
| PN-junction heating device - Temperature-control range | Room temperature to 100℃ |
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