HunterATE intelligent manufacturing test system
Xinertai's intelligent equipment provides a wide range of intelligent manufacturing test solutions for manufacturers of data-communications, optical and other electronic products. Production-test software platforms, hardware instruments, test modules and integrated solutions improve production testing across chip tests, board tests, complete-unit tests and reliability screening, making manufacturing capability a core competitive advantage for customers' commercial success. The HunterATE test platform consists of a chassis, P-series cards and TeleATT production automation test software. BigTao chassis are card-based tester hosts requiring test modules, with two models by slot count: BigTao210 (2 slots) and BigTao6100 (6 slots). A fully configured six-slot BigTao6100 provides 96 gigabit test ports for centralized production-line testing. Its built-in Linux system automatically controls fan and other operating states and allocates energy use efficiently, enabling long-duration continuous (N*24 hours), stable, low-cost operation. Interface-rate standards define P6000 Ethernet traffic test modules, P8000 Ethernet traffic test modules, P2-2.5G Ethernet traffic test modules, P2-10G Ethernet traffic test modules, P2-100G Ethernet traffic test modules, P6008W WiFi traffic test modules, P6216W wireless coupling test modules, the Hunter CW1600 coupling tester, Hunter OCT-8 BOB comprehensive tester, Hunter ERM-2500-8 extinction-ratio tester and Hunter BERT-10G-4F bit-error analyzer. TeleATT is Xinertai's automated test software for production testing. With suitable Xinertai chassis and interface cards, it performs batch, parallel and automated traffic tests on a DUT (device under test). It is suitable for production-assembly testing of small network devices such as box-type switches, ONUs and home routers.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Supported basic function tests [Selected manual page 27] | 30+ |
| One-button fixture-configuration copying [After configuring devices under a single fixture] | 16 Fixture |
| Number of DUTs supported in combined parallel testing | 1–16 units |
| Improvement in test efficiency and first-pass yield [Relative to version 1.0; the original describes both items] | At least 30 |
| Round-the-clock operation | 7 hours × 24 hours |
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