X-Ray Crystal Orientation Instrument
A crystal-orientation instrument measures the angle between a geometric surface and an internal crystal plane in quartz, silicon/germanium single crystals, laser crystals and other materials. Components include an X-ray tube/housing, air-cooling motor, specimen, counter, amplifier, digital display, meter, regulator, controller, high-voltage generator/cable and suction pump. The measurement path passes from the X-ray tube through a monochromator and specimen to the counter. A quartz plate with a defined crystallographic cut angle monochromatizes the primary X-rays, selecting one wavelength and improving measurement to the ±15″ class. X-ray diffraction rapidly determines cutting angles of natural and artificial piezoelectric, optical, laser and semiconductor crystals; combined with a cutter, it supports oriented cutting and precision crystal-device manufacturing. The instrument is used in crystal research, processing and production. The stated X-ray orientation-instrument measurement accuracy is ±30″, with digital display and minimum reading 10″. An improved goniometer, load-bearing rail, tube housing, support and raised specimen stage accommodate samples weighing 1~30kg and measuring 2~8 inches in diameter. Digital angle display has ±30″ measurement accuracy. X-ray diffraction enables precise, rapid crystal cutting-angle measurement and oriented cutting for research and manufacturing.
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