Orientation Instrument
Function: The instrument is used mainly for the orientation of the silicon monolithium column, for the determination of the OF surface and for the determination of the OF surface of other semiconductor monolithic OS surfaces, which are placed vertically on the workstation and are measured in X-RAY exposure.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Input Power [50Hz] | Single-stage communication 220V, 50Hz, 0.3KW. |
| Plumb voltage. | 30 kV |
| Tube Current [Consequences.] | 0-5mA continuous |
| Receiver | Geiger counter, working voltage high of DC1050V. |
| X-Ray Tube | Copper target, fan cooling, anode grounding. |
| Orientation Accuracy [Measured using the 10ī1 face of a standard quartz plate] | ±30" (measured using the 10ī1 face of a standard quartz plate) |
| Small readings | 1 " |
| Dimensions | 1290 (length) x 772 (width) x 1300 (height) mm |
| Instrument Weight | 300kg。 |
| The sky diameter | Φ200 |
| Big length of the gin | 500 mm |
| Pointed Crystal | 110-D. |
Datasheet
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