Wafer-Level Diffractive Optical Waveguide Inspection System Metrondie-SRG
Metrondie-SRG wafer-level diffractive-waveguide optical inspection combines angle-resolved spectroscopy,AI and traceable standards to quickly obtain one-/two-dimensional grating efficiency/morphology. Rapid nondestructive monitoring during design/fabrication improves yield.
Request a Quote
Download Datasheet
Overview
Metrondie-SRG wafer-level diffractive-waveguide optical inspection combines angle-resolved spectroscopy,AI and traceable standards to quickly obtain one-/two-dimensional grating efficiency/morphology. Rapid nondestructive monitoring during design/fabrication improves yield.
Specifications
| Parameter | Value |
|---|---|
| System Functions | Grating diffraction efficiency measurement, grating period metrology, grating morphology measurement, grating orientation measurement |
| Grating Type | Supports one-dimensional and two-dimensional gratings |
| Wafer Size | 4~12 inch |
| Measurement Mode -Scatterometry | Incidence -70~70°, reception -70~70° |
| Measurement Mode -Littrow | -70~70° |
| Measurement Mode -Reflection | 0~70° |
| Grating Diffraction Efficiency - Spectral Range | 200~800nm |
| Grating Diffraction Efficiency - Measurement Range [@ 532nm] | 0.1% @ 532nm |
| Grating Diffraction Efficiency - Repeatability [@ 532nm] | <±1% @ 532nm |
| Grating Period - Spectral Range | 200~1000nm |
| Grating Period - Measurement Range | ≤±100pm |
| Grating Period - Repeatability | <±10pm |
| Grating Morphology - Accuracy | ±2% (typ.), ≤±1% (min) |
| Grating Morphology - Test Time [@ one Die (1point)] | <40s @ one Die (1point) |
| Grating Orientation - Repeatability | <3' |
| Sample Stage-Adjustment Dimensions | Four-dimensional (X, Y, Z, θ) |
| Sample Stage - Adjustment Accuracy | X: ±5μm; Y: ±5μm; Z: ±0.3μm; θ: ±3'' |
| Equipment Dimensions | 1700 mm³ × 1000 mm³ × 2300 mm³ |
Applications
Grating diffraction-efficiency measurement: diffraction efficiency is a core grating-performance indicator, requiring simultaneous angular and wavelength measurement. Grating-period metrology: period is a fundamental diffractive-waveguide parameter affecting proper light propagation and diffraction; traceability is essential, using reference materials that support reproducibility and measurement-value transfer. Grating-morphology measurement: high-performance diffractive waveguides have complex grating morphology. Rapid nondestructive inspection is a core need in batch wafer processing, requiring multidimensional optical-signal acquisition and efficient AI analysis. Grating-orientation measurement: orientation differences between gratings in different waveguide regions are critical to imaging, requiring precise rotation-angle adjustment.
Key Features
Angle-resolved spectroscopy: a wide angular range of -70°~70° and angular accuracy better than 0.02° accurately capture the distribution of multiple diffraction-order intensities versus wavelength and angle. Wafer-level measurement: a highly compatible sample stage covers full inspection of 4~12-inch wafers. Intelligent software accepts wafer layouts for batch mapping of diffractive optical-waveguide wafers. Artificial-intelligence algorithms: online optimization, deep learning and library search closely integrate physical models with multidimensional spectral information, enabling construction and optimization of large model sets and real-time extraction of precise diffractive-waveguide grating morphology parameters. High-precision motorized stage: a four-axis stage provides micrometer-level positioning in X, Y and Z and arcsecond-level angular positioning for in-plane orientation θ, supporting comprehensive automated diffractive-waveguide inspection.
Datasheet
Please provide your email to download the datasheet.
Your name
Email Address
Invalid email format. Please try again.
Send Request
Supplier Information
Shanghai Ideaoptics Co., Ltd. is a national-level specialized and sophisticated 'Little Giant' enterprise, a deep-spectrum technology innovator. Devoted to the micro-nano optoelectronic field, it develops intelligent full-spectrum technology integrating photonics and AI, building an internationally leading deep-spectrum platform. The company provides comprehensive solutions from technology to products, including micro spectrometers, angle-resolved spectrometers, and confocal Raman spectrometers, widely applied in IC chips, optical chips, biochips, AR/VR, and advanced displays. Through joint R&D centers with universities, Ideaoptics continuously launches breakthrough products, serving over 3,000 customers and cooperating with 170+ semiconductor, advanced materials, and biomedical enterprises, aiming to advance photonic integration and empower semiconductor manufacturing.
Contact Us
Loading...
GetExperimental Plan
Name
Phone
+86
Organization
Use Case

Global Photonics Products
Database Platform
Database Platform
With 16 years of experience, we provide high-quality products and services to universities, research institutes, and industry.
50+ Detailed Categories · 3,000+ Global Brands · 100,000+ Photonics Products
1 Million+
In-depth analysis of professional academic resources in photonics
300,000
ProductsDatasheets Available Free
We will keep your personal information strictly confidential.
Product Quote
+86
* Select the quoting party:
By submitting, you agree to the User Service Agreement and Privacy Policy