AWG & PLC Waveguide Chip Automatic Test Station
1. Supports coupling tests for AWG/PLC chips of various specifications. 2. Fully automatic, high-precision 14-axis motorized modules enable a complete workflow without human intervention. 3. High-precision eddy-current sensors improve test accuracy and repeatability. 4. Fast light-search coupling algorithms and scanning tests. 5. Supports automatic dispensing of index-matching fluid and probe lowering. 6. Various tunable sources and polarization controllers can be shared by multiple parallel workstations.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Repeatability [IL/PDL Variation During Repeated Coupling of the Same Chip] | <0.1 dB |
| Stability [Maximum IL Variation Within 5 Minutes After Applying Index-Matching Fluid] | <0.05 dB |
| Test Accuracy | <0.2 dB |
| Initial Optical Alignment Cycle Time [Time from Chip Loading to Finding the Initial Light] | <3 min |
| Repeat Optical Alignment Cycle Time [Coupling Time for Each Subsequent Item in the Bar, Excluding the First Item's Initial Light-Finding Time] | <25 s |
| Scan Test Cycle Time [1260-1350nm; four-phase Mueller-matrix algorithm] | <15 s |
Datasheet
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Supplier Information
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