X-Ray Fluorescence Spectrometer (XRF)
The X-ray fluorescence spectrometer is a scientific instrument used to analyze the elemental composition of samples. It uses X-rays to excite the atoms of the sample and measures the spectrum of specific energies produced by the sample's fluorescence. By analyzing the characteristic fluorescence peaks of each element in the sample, the types and contents of elements in the sample can be obtained. Betop Science's X-ray fluorescence spectrometer THOR X features high resolution, high accuracy and rapid analysis, suitable for many fields such as materials science and environmental
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Overview
Specifications
| Parameter | Value |
|---|---|
| X Pin Element Analysis Range | Sulfur (S) to uranium (U) |
| X Pin Content Analysis Range | 1ppm～99.99% |
| X Pin Simultaneously Analyzed Elements | Can measure 30+ elements in a single run |
| X Pin RoHS Directive Elements | Cd/Pb/Cr/Hg/Br |
| X Pin Measurement Time | 60～300s |
| X Pin Excitation Power | 50W |
| X Pin Detector | Si-Pin |
| X Pin Detector Energy Resolution | Up to 139 eV@5.9keV(Fe55) |
| X Pin Cooling | Level 2 |
| X Pin Measurement Objects | Solid, powder, liquid |
| X Pin Main Unit Weight | 45kg |
| X Pin Operating Conditions | AC 220V/5A, 0~40°C, humidity |
| X SDD Element Analysis Range | Sulfur (S) to uranium (U) |
| X SDD Content Analysis Range | 1ppm～99.99% |
| X SDD Simultaneously Analyzed Elements | Can measure 30+ elements in a single run |
| X SDD RoHS Directive Elements | Cd/Pb/Cr/Hg/Br |
| X SDD Measurement Time | 60～300s |
| X SDD Excitation Power | 50W |
| X SDD Detector | SDD |
| X SDD Detector Energy Resolution | Up to 125 eV@5.9keV(Fe55) |
| X SDD Cooling | Level 2 |
| X SDD Measurement Objects | Solid, powder, liquid |
| X SDD Main Unit Weight | 45kg |
| X SDD Operating Conditions | AC 220V/5A, 0~40°C, humidity |
Applications
Key Features
Datasheet
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Supplier Information
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